Introduction & Context

In comminution circuits, the Rosin‑Rammler (RR) distribution is the industry‑standard model for describing the size distribution of milled particles, but for a more detailed statistical analysis many engineers turn to log‑normal distribution fitting for particle size distribution, which provides a complementary view of the PSD shape and variance.

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Methodology & Formulas

  1. Particle-size distribution model
    The RR equation gives the mass-percent retained on a sieve of aperture \(d\): \[ R(d)=100\;\exp\!\left[-\left(\frac{d}{D'}\right)^{\!n}\right] \] where
    • \(D'\) is the characteristic size (µm) at which 36.8 % of the mass is retained,
    • \(n\) is the uniformity index (dimensionless); higher \(n\) ⇒ steeper slope ⇒ narrower distribution.
  2. Ultrafines calculation
    The mass-percent passing the target sieve \(d_{\text{sieve}}\) is \[ P(d_{\text{sieve}})=100-R(d_{\text{sieve}}). \] Excess fines are declared whenever \(P(d_{\text{sieve}})\) exceeds the set-point \(P_{\text{target}}\).
  3. Operating envelope
    Parameter Lower limit Upper limit Remarks
    Uniformity index \(n\) 0.8 1.5 RR correlation validated only within this band
    Moisture content 12 % 15 % Brittleness assumptions hold; prevents coating
    Characteristic size \(D'\) > 0 µm Negative values are physically impossible